SURF: Announcements of Opportunity
Below are Announcements of Opportunity posted by Caltech faculty and JPL technical staff for the SURF program. Additional AOs for the Amgen Scholars program can be found here.
Specific GROWTH projects being offerred for summer 2017 can be found here.
Students pursuing opportunities at JPL must be U.S. citizens or U.S. permanent residents.
Each AO indicates whether or not it is open to non-Caltech students. If an AO is NOT open to non-Caltech students, please DO NOT contact the mentor.
Announcements of Opportunity are posted as they are received. Please check back regularly for new AO submissions! Remember: This is just one way that you can go about identifying a suitable project and/or mentor.
Announcements for external summer programs are listed here.
|Project:||Nanofabrication Study using He, Ne & Ga Focused Ion Beam System|
|Disciplines:||Physics, Materials Science|
John G. Braun Professor of Applied Physics, (EAS),
|Mentor URL:||https://copilot.caltech.edu/ (opens in new window)|
|AO Contact:||Matthew Hunt, email@example.com|
|Background:||Focused Ion Beam (FIB) microscopy has been used in device fabrication and material characterization for a few decades, commonly leveraging a gallium liquid metal ion source (LMIS) and scanning beam technology to directly machine features on length scales ranging from 10s of nanometers to 10s of micrometers. Recent advances in gas field ion sources (GFIS) have allowed for the development of He and Ne ion microscopy, which use an order of magnitude smaller probe size to machine sub-10 nm features and acquire images with sub-nm resolution. The Kavli Nanoscience Institute (KNI) has recently installed a He/Ne/Ga tri-beam system in its on-campus cleanroom to aid in device fabrication and characterization. The selected student will use the new microscope to study the effects of beam--specimen interactions on device performance by creating and testing nanoscale structures. The project will be co-mentored by Professor of Applied Physics and KNI Co-Director, Oskar Painter, and KNI staff microscopist, Matthew Hunt.|
|Description:||The student will develop a study that characterizes a way -- or ways -- in which He/Ne/Ga ion beam species impact the performance of the kinds of electronic, optical and mechanical devices that are typically fabricated in the KNI. For example, the student may (1) conceive of test structures that could be used to isolate edge geometry or ion implantation effects, (2) use the ion microscope to create those structures on semiconductor and/or insulator materials, then (3) characterize them via bench-top electronic and/or optical measurement. The student will be instructed on the principles and operation of ion and electron microscopy, and any other necessary fabrication and characterization techniques available in the cleanroom.|
Painter Lab Research: https://copilot.caltech.edu/research
He/Ne/Ga FIB (Zeiss Orion NanoFab): http://tinyurl.com/jgxzunt
Intro to Focused Ion Beams: http://www.springer.com/us/book/9780387231167
Intro to Scanning Electron Microscopy: http://www.springer.com/us/book/9780306472923
|Student Requirements:||Coursework in physics and materials science; detail-oriented approach to optimization is necessary for fabrication; experience with optical/electronic measurement systems is desired.|
This AO can be done under the following programs:
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